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专利名称：Deterioration analysis method and chemical
state measurement method
发明人：Fusae Kaneko,Hiroyuki Kishimoto申请号：US14046658申请日：20131004公开号：US09128077B2公开日：20150908
专利附图：
摘要：The present invention provides a deterioration analysis method capable ofanalyzing in detail deterioration of a polymer material, and in particular deterioration inthe surface condition of a polymer material with low conductivity. The present invention
relates to a deterioration analysis method including irradiating a polymer material with ametal coating having a thickness of 100 Å or less formed thereon, with high intensity X-rays, and measuring X-ray absorption while varying the energy of the X-rays, to analyzedeterioration of the polymer.
申请人：SUMITOMO RUBBER INDUSTRIES, LTD.
地址：Kobe-shi, Hyogo JP
国籍：JP
代理机构：Birch, Stewart, Kolash & Birch, LLP
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